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Issue No. 04 - July/August (1987 vol. 4)
ISSN: 0740-7475
pp: 4-14
ABSTRACT
Provides a listing of upcoming conference events of interest to practitioners and researchers.
INDEX TERMS
CITATION

"International Test Conference 1987," in IEEE Design & Test of Computers, vol. 4, no. , pp. 4-14, 1987.
doi:10.1109/MDT.1987.295142
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