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Issue No. 02 - March/April (vol. 4)
ISSN: 0740-7475

Editorial Board (PDF)

pp. 1

Editorial Board (PDF)

pp. 2

D&T Letters (PDF)

pp. 3

D&T Scene (PDF)

pp. 8-9

D&T Standards (PDF)

pp. 10-11

Testing Mixed-Signal Devices (Abstract)

Randall Kramer , Teradyne
pp. 12-20

Timing Accuracy in Modern ATE (Abstract)

Walter Satre , AT&T Bell Laboratories
Mark Barber , AT&T Bell Laboratories
pp. 22-30

Aliasing Errors in Signature in Analysis Registers (Abstract)

C.W. Starke , IBM Boeblingen, FRG
T.W. Williams , IBM Boulder
W. Daehn , Universitaet Hannover, FRG
M. Gruetzner , Universitaet Hannover, FRG
pp. 39-45

The Effects of Modeling on Simulator Performance (Abstract)

Dipti Mohapatra , Schlumberger Palo Alto Research
Katie Kaufman , Schlumberger Palo Alto Research
Alexander Miczo , Schlumberger Palo Alto Research
Scott Perkins , Schlumberger Palo Alto Research
Ken Huang , Schlumberger Palo Alto Research
pp. 46-54

New Products Design (PDF)

pp. 55-56

New Products Test (PDF)

pp. 57-59

Industry Briefs (PDF)

pp. 60

D&T Conferences (PDF)

pp. 61-63

Erratum (PDF)

pp. 62

IEEE Design&Test of Computers (PDF)

pp. 64-a-64-b

D&T Calendar (PDF)

pp. 64-c
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