Issue No. 01 - January/February (1987 vol. 4)
Sudhakar Reddy , University of Iowa
R. Dandapani , University of Colorado
Classical scan designs require properly augmented flip-flops, often called scan flip-flops. Problems stem from the high areaoverhead implied by the need for these flip-flops or the inability to modify standard flip-flops. The authors outline a methodto design easily testable sequential circuits that achieve scan designs using standard (unmodified) flip-flops.
R. Dandapani and S. Reddy, "Scan Design Using Standard Flip-Flops," in IEEE Design & Test of Computers, vol. 4, no. , pp. 52-54, 1987.