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Issue No. 01 - January/February (1987 vol. 4)
ISSN: 0740-7475
pp: 52-54
R. Dandapani , University of Colorado
Sudhakar Reddy , University of Iowa
ABSTRACT
Classical scan designs require properly augmented flip-flops, often called scan flip-flops. Problems stem from the high areaoverhead implied by the need for these flip-flops or the inability to modify standard flip-flops. The authors outline a methodto design easily testable sequential circuits that achieve scan designs using standard (unmodified) flip-flops.
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CITATION
R. Dandapani, Sudhakar Reddy, "Scan Design Using Standard Flip-Flops", IEEE Design & Test of Computers, vol. 4, no. , pp. 52-54, January/February 1987, doi:10.1109/MDT.1987.295115
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