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Issue No. 06 - November/December (vol. 3)
ISSN: 0740-7475

Editorial Board (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

The Original (PDF)

pp. 9

D&T Scene (PDF)

pp. 10

Call for Papers (PDF)

pp. 11

Macro Testing: Unifying IC And Board Test (Abstract)

F.N. Peacock , Philips Telecommunications and Data Systems
R.B.W. Gerritsen , Philips Telecommunications and Data Systems
F.P.M. Beenker , Philips Research Labs
K.j.e. Eerdewijk , Philips Research Labs
M. Der Star , Philips Telecommunications and Data Systems
pp. 26-32

Self-Test in a Standard Cell Environment (Abstract)

W. Daehn , University of Hanover, FRG
J.P. Mucha , University of Hanover, FRG
J. Gross , University of Hanover, FRG
pp. 35-41

Second Call for Papers (PDF)

pp. 42

A D&T Tutorial (Abstract)

pp. 43-50

ATE Seminars (PDF)

pp. 50

D&T Referees (PDF)

pp. 51

New Products Design (PDF)

pp. 52

New Products Test (PDF)

pp. 53

D&T Standards (PDF)

pp. 54

D&T Conferences (PDF)

pp. 55-56

D&T Calendar (PDF)

pp. 56

Annual Index (PDF)

pp. 58-61

Book Reviews (PDF)

pp. 63

In the next D&T... (PDF)

pp. 63

IEEE Design&Test of Computers (PDF)

pp. 64-a-64-b
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