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Issue No. 06 - November/December (1986 vol. 3)
ISSN: 0740-7475
pp: 35-41
W. Daehn , University of Hanover, FRG
J.P. Mucha , University of Hanover, FRG
J. Gross , University of Hanover, FRG
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CITATION
W. Daehn, J.P. Mucha, J. Gross, "Self-Test in a Standard Cell Environment", IEEE Design & Test of Computers, vol. 3, no. , pp. 35-41, November/December 1986, doi:10.1109/MDT.1986.295051
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