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Issue No. 06 - November/December (1986 vol. 3)
ISSN: 0740-7475
pp: 26-32
F.N. Peacock , Philips Telecommunications and Data Systems
R.B.W. Gerritsen , Philips Telecommunications and Data Systems
F.P.M. Beenker , Philips Research Labs
K.j.e. Eerdewijk , Philips Research Labs
M. Der Star , Philips Telecommunications and Data Systems
ABSTRACT
Historically, IC testing and board testing have been considered two separate subjects. However, today's increasing complexityin both design and technology has given rise to a number of efforts to produce a consistent test strategy that smoothly couplesboth types of testing. This article describes one such effort by Philips, a design for testability methodology for semicustomVLSI circuits. The methodology is based on the partitioning of a design into testable macros, hence the term ?macro testing.?The challenges in this approach are the partitioning itself, the selection of a test technique suited to the separate macrosand the chip's architecture, the execution of a macro test independent of its environment, and the assembly of macro testsinto a chip test.
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CITATION
F.N. Peacock, R.B.W. Gerritsen, F.P.M. Beenker, K.j.e. Eerdewijk, M. Der Star, "Macro Testing: Unifying IC And Board Test", IEEE Design & Test of Computers, vol. 3, no. , pp. 26-32, November/December 1986, doi:10.1109/MDT.1986.295048
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