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Issue No. 05 - September/October (vol. 3)
ISSN: 0740-7475

IEEE Computer Society (PDF)

pp. c2

Editor Board (PDF)

pp. 4

D&T Scene (PDF)

pp. 5

D&T Roundtable (PDF)

pp. 6-71

D&T Calendar (PDF)

pp. 8-71

Program Highlights (PDF)

pp. 9

Testability: Barriers to Acceptance (Abstract)

Kenneth Parker , Hewlett-Packard
pp. 11-15

Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops (Abstract)

Sudhakar Reddy , University of Iowa
Madhukar Reddy , University of Iowa
pp. 17-26

Built-in Self Testing of Embedded Memories (Abstract)

Charles Stroud , AT&T Bell Laboratories
Sunil Jain , AT&T Bell Laboratories
pp. 27-37

Software Quality Assurance And CAD User Interfaces (Abstract)

E.T. Grinthal , AT&T Bell Laboratories
pp. 39-48

Gould (PDF)

pp. 48

Computer-Aided-Design Research at the Ge Microelectronics Center (Abstract)

Gary Leive , General Electric Corporation
David Hightower , General Electric Corporation
Robert Griffin , General Electric Corporation
Aart Geus , General Electric Corporation
Patrick Fasang , General Electric Corporation
pp. 49-56

New Products Design (PDF)

pp. 57-58

New Products Test (PDF)

pp. 59

D&T Conferences (PDF)

pp. 60-63

Book Reviews (PDF)

pp. 70

Call for Papers (PDF)

pp. 71

IEEE Design&Test of Computers (PDF)

pp. 72-a-72-b
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