The Community for Technology Leaders
Green Image
Issue No. 05 - September/October (1986 vol. 3)
ISSN: 0740-7475
pp: 17-26
Sudhakar Reddy , University of Iowa
Madhukar Reddy , University of Iowa
The authors present evidence that conventional tests cannot detect FET stuck-open faults in several CMOS latches and flip-flops.Examples are given to show that stuck-open faults can change static latches and flip-flops into dynamic devices?a danger tocircuits whose operation requires static memory, since undetected FET stuck-open faults can cause malfunctions. Designs aregiven for several memory devices in which all single FET stuck-open faults are detectable. These memory devices include commonlatches, master-slave flip-flops, and scan-path flip-flops that can be used in applications requiring static memory elementswhose operation can be reliably ascertained through conventional fault testing methods.
Sudhakar Reddy, Madhukar Reddy, "Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops", IEEE Design & Test of Computers, vol. 3, no. , pp. 17-26, September/October 1986, doi:10.1109/MDT.1986.295040
94 ms
(Ver 3.1 (10032016))