Issue No. 05 - September/October (1986 vol. 3)
Madhukar Reddy , University of Iowa
Sudhakar Reddy , University of Iowa
The authors present evidence that conventional tests cannot detect FET stuck-open faults in several CMOS latches and flip-flops.Examples are given to show that stuck-open faults can change static latches and flip-flops into dynamic devices?a danger tocircuits whose operation requires static memory, since undetected FET stuck-open faults can cause malfunctions. Designs aregiven for several memory devices in which all single FET stuck-open faults are detectable. These memory devices include commonlatches, master-slave flip-flops, and scan-path flip-flops that can be used in applications requiring static memory elementswhose operation can be reliably ascertained through conventional fault testing methods.
S. Reddy and M. Reddy, "Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops," in IEEE Design & Test of Computers, vol. 3, no. , pp. 17-26, 1986.