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Issue No. 04 - July/August (vol. 3)
ISSN: 0740-7475

International Test Conference 1986 (PDF)

pp. itc-1-itc-4

International Test Conference (PDF)

pp. itc-14-itc-32

Test Your Limits (PDF)

pp. c2-1

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

Dedicated to Change (PDF)

pp. 8

D&T Scene (PDF)

pp. 10-11

Erratum (PDF)

pp. 11

About the Cover... (PDF)

pp. 11

The Future of Test (PDF)

pp. 13-14

Integrating an Electron-Beam System into VLSI Fault Diagnosis (Abstract)

Norio Kuji , NTT Electrical Communications Laboratories
Teruo Tamama , NTT Electrical Communications Laboratories
pp. 23-29

Test Week Tutorials (Abstract)

pp. itc-8-itc-11

1986 Program Overview (PDF)

pp. itc-12-itc-13

SMART And FAST: Test Generation for VLSI Scan-Design Circuits (Abstract)

M. Abramovici , AT&T Information Systems
J.J. Kulikowski , AT&T Information Systems
P.R. Menon , AT&T Information Systems
D.T. Miller , AT&T Information Systems
pp. 43-54

Test Considerations for Gate Oxide Shorts in CMOS ICs (Abstract)

Charles Hawkins , University of New Mexico
Jerry Soden , Sandia National Laboratories
pp. 56-64

D&T Standards (PDF)

pp. 65

D&T Conferences (PDF)

pp. 68-70

New Products Design (PDF)

J. Nash , Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730
pp. 72

New Products Test (PDF)

Conrad Zagwyn , LTX Corporation/LXT at University/Westwood, MA 02090
pp. 73-75

Book Reviews (PDF)

Robert Anderson , GenRad Inc., PO Box 32183, Phoenix, AZ 85064
pp. 76-77

Calendar (PDF)

pp. 78

Call for Papers (PDF)

pp. 79

IEEE Design&Test of Computers (PDF)

pp. 80-a-80-b

Freezing! (PDF)

pp. 80-c
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