Issue No. 04 - July/August (1986 vol. 3)
M. Abramovici , AT&T Information Systems
J.J. Kulikowski , AT&T Information Systems
P.R. Menon , AT&T Information Systems
D.T. Miller , AT&T Information Systems
This article describes new concepts and algorithms used to generate tests for VLSI scan-design circuits. The new algorithmsinclude: 1. a low-cost fault-independent algorithm (SMART), 2. a fault-oriented algorithm (FAST), and 3. an algorithm fordynamic test set compaction. The fault-oriented algorithm is guided by new controllability/observability cost functions whoseobjective is to minimize the amount of search done in test generation.
M. Abramovici, J. Kulikowski, P. Menon and D. Miller, "SMART And FAST: Test Generation for VLSI Scan-Design Circuits," in IEEE Design & Test of Computers, vol. 3, no. , pp. 43-54, 1986.