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Issue No. 04 - July/August (1986 vol. 3)
ISSN: 0740-7475
pp: itc-14-itc-32
ABSTRACT
Provides a listing of upcoming conference events of interest to practitioners and researchers.
INDEX TERMS
CITATION
"International Test Conference", IEEE Design & Test of Computers, vol. 3, no. , pp. itc-14-itc-32, July/August 1986, doi:10.1109/MDT.1986.294973
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