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Issue No. 04 - July/August (1986 vol. 3)
ISSN: 0740-7475
pp: itc-1-itc-4
ABSTRACT
Provides a listing of upcoming conference events of interest to practitioners and researchers.
INDEX TERMS
CITATION

"International Test Conference 1986," in IEEE Design & Test of Computers, vol. 3, no. , pp. itc-1-itc-4, 1986.
doi:10.1109/MDT.1986.294969
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