Issue No. 04 - July/August (1986 vol. 3)
ISSN: 0740-7475
pp: 13-14
INDEX TERMS
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CITATION
"The Future of Test", IEEE Design & Test of Computers, vol. 3, no. , pp. 13-14, July/August 1986, doi:10.1109/MDT.1986.294963
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