The Community for Technology Leaders
Green Image
Issue No. 03 - May/June (vol. 3)
ISSN: 0740-7475

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

D&T Scene (PDF)

pp. 14

Workstations: A Closer Look (PDF)

pp. 16-17

IC Design Capability Conversion from Mainframe to Workstation Environment (Abstract)

John Wisniewski , Sandia National Laboratories
Dave Palmer , Sandia National Laboratories
pp. 18-24

Benchmarking Engineering Workstations (Abstract)

Mark Linton , Stanford University
pp. 25-30

A Supercomputer Workstation for VLSI CAD (Abstract)

Rolf-dieter Fiebrich , Thinking Machines Corporation
pp. 31-37

VEGA: A Visual Modeling Language for Digital Systems (Abstract)

Akira Sugimoto , Mitsubishi Electric Corporation
pp. 38-45

A Wirelist Compare Program for Verifying VLSI Layouts (Abstract)

Edward McGrath , Digital Equipment Corporation
K.L. Kodandapani , Digital Equipment Corporation
pp. 46-51

A New Economical Implementation for Scannable Flip-Flops in MOS (Abstract)

Dilip Bhavsar , Digital Equipment Corporation
pp. 52-56

D&T Standards (PDF)

pp. 64

New Products Design (PDF)

J. Nash , Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730.
pp. 65-67

New Products Test (PDF)

Conard Zagwyn , International Test Conference, 295 Valley St., Pembroke, MA 02359
pp. 68-69

Calendar (PDF)

pp. 70

Call for Papers (PDF)

pp. 71

IEEE Design&Test of Computers (PDF)

pp. 72-a-72-b

We Set the Standards (PDF)

pp. 72-c
97 ms
(Ver 3.1 (10032016))