Issue No. 03 - May/June (1986 vol. 3)
Dilip Bhavsar , Digital Equipment Corporation
A New implementation for scannable flip-flops in MOS is economical for use in systems that use single latch design. The ?SystemLatch-Scannable Flop? (SL-SF) requires two additional transfer gates, two test clocks, and possibly a test mode signal. Hardwarepernalties paid in SL-SF can be the least among other implementations with equivalent test functionality. This article discussesSL-SF only in the context of its scan-path implementation; its applicability to linear feedback shift-register-based self-testshould be obvious.
D. Bhavsar, "A New Economical Implementation for Scannable Flip-Flops in MOS," in IEEE Design & Test of Computers, vol. 3, no. , pp. 52-56, 1986.