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Issue No. 02 - March/April (vol. 3)
ISSN: 0740-7475

VHDL - Feature Description And Analysis (Abstract)

J.H. Aylor , University of Virginia
R. Waxman , IBM Corporation
C. Scarratt , IBM Corporation
pp. 17-27

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

D&T Scene (PDF)

pp. 6-7

Erratum (PDF)

pp. 7

About the Cover (PDF)

pp. 7

VHDL ?The Designer Environment (Abstract)

Alfred Gilman , Intermetrics Incorporated
pp. 42-47

VHDL's Impact on Test (Abstract)

Al Lowenstein , Prospective Computer Analysts
Greg Winter , Prospective Computer Analysts
pp. 48-53

Missing Back Issues? (PDF)

pp. 53

VHDL Critique (Abstract)

J.D. Nash , Raytheon Company
L.F. Saunders , IBM Corporation
pp. 54-65

WRAPLE: The Weighted Repair Assistance Program Learning Extension (Abstract)

W.R. Simpson , ARINC Research Corporation
C.S. Dowling , ARINC Research Corporation
pp. 66-73

D&T Roundtable (PDF)

pp. 74-78

D&T Conferences (PDF)

pp. 79-83

New Products Design (PDF)

J. Nash , Raytheon, Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730
pp. 84

New Products Test (PDF)

Conrad Zagwyn , International Test Conference, 295 Valley St., Pembroke, MA 02359
pp. 85

Calendar (PDF)

pp. 86

D&T Education (PDF)

pp. 87

IEEE Design&Test of Computers (PDF)

pp. 88-a-88-b
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