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Issue No. 02 - March/April (1986 vol. 3)
ISSN: 0740-7475
pp: 48-53
Al Lowenstein , Prospective Computer Analysts
Greg Winter , Prospective Computer Analysts
ABSTRACT
High-tech microcircuits command a modernized approach to design and test. This approach, born of harsh economic reality, mandatesthat effective test be inextricably tied to design. The test generation problem is enormous and requires automatic test programgenerators that in turn require computer-readable descriptions of the unit under test. The government-sponsored VHSIC HardwareDescription Language, or VHDL, addresses both design and test needs, allowing both efforts to work together to reduce productcost while improving product quality. In this article, we focus on the needs of test throughout a product's life cycle andexplain how VHDL serves those needs.
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CITATION

G. Winter and A. Lowenstein, "VHDL's Impact on Test," in IEEE Design & Test of Computers, vol. 3, no. , pp. 48-53, 1986.
doi:10.1109/MDT.1986.294903
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