Issue No. 01 - January/February (1986 vol. 3)
H.s. Fung , GTE Laboratories, Inc.
S. Hirschhorn , GTE Laboratories, Inc.
This article discusses design for testability automation for the Silc silicon compiler under development at GTE Laboratories,Inc. Our modular design for testability uses both built-in self-test and scan-path techniques for Slic's full custom VLSIdesigns. A test controller coordinates the testing of the chip's modules. Testability evaluation is performed using controllability/observabilitymethods, and using a method based on information theory. A testable-by-construction approach is followed in order to synthesizeblocks of testable logic. A testability ?expert? manages testability knowledge during the synthesis process and makes theultimate testability decisions.
S. Hirschhorn and H. Fung, "An Automatic DFT System for the Silc Silicon Compiler," in IEEE Design & Test of Computers, vol. 3, no. , pp. 45-57, 1986.