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Issue No. 06 - November/December (vol. 2)
ISSN: 0740-7475

Noise Problems in Testing VLSI Hardware (Abstract)

Kofi E. Torku , IBM Corporation
Dave A. Kiesling , IBM Corporation
pp. 36-43

IEEE Computer Society (PDF)

pp. 2

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

D&T Scene (PDF)

pp. 7-10

Inductive Fault Analysis of MOS Integrated Circuits (Abstract)

John Shen , Carnegie-Mellon University
W. Maly , Carnegie-Mellon University
F. Ferguson , Carnegie-Mellon University
pp. 13-26

Call for Papers (PDF)

pp. 88c

Autoprobing on the L200 Functional Tester (Abstract)

Tim Moore , Digital Equipment Corp.
Stephen Garner , Digital Equipment Corp.
pp. 44-49

IEEE-488 (PDF)

pp. 49

Operational Life Testing of Electronic Components (Abstract)

David Farnholtz , AT&T Technology Systems
pp. 50-56

Gate-Level Simulation (Abstract)

pp. 63-71

D&T Conferences (PDF)

pp. 72-76

D&T Reviewers (PDF)

pp. 77-78

Calendar (PDF)

pp. 79-81

Call for Papers (PDF)

pp. 81

IEEE Design&Test Computers (PDF)

pp. 82-87

IEEE Design&Test of Computers (PDF)

pp. 88-a-88-b

Call for Papers (PDF)

pp. 88-c
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