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Issue No. 06 - November/December (1985 vol. 2)
ISSN: 0740-7475
pp: 44-49
Tim Moore , Digital Equipment Corp.
Stephen Garner , Digital Equipment Corp.
The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose productionmodules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasingthe average diagnostic time, through automatic control of the probe's movement and positioning. The X-Y autoprobing systemsinstalled have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.

T. Moore and S. Garner, "Autoprobing on the L200 Functional Tester," in IEEE Design & Test of Computers, vol. 2, no. , pp. 44-49, 1985.
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