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Issue No. 06 - November/December (1985 vol. 2)
ISSN: 0740-7475
pp: 27-35
Peter Odryna , Carnegie-Mellon University
Andrzej Strojwas , Carnegie-Mellon University
Faults in the manufacturing of VLSI chips lower the effective yield, thus increasing manufacturing cost. Early diagnosis offaults can avoid this sitution. Such diagnoses can be made by PROD, a diagnostic expert system that analyzes the joint probabilitydensity function of measured IC parameters density fuction of measured IC parameters to determine the source of faults resultingin faults chips. PROD can identify both parametric and catastrophic faults, and the expert system can be expanded to diagnosefaults that cannot be described quantitatively. This article describes PROD's diagnostic algorithms and their implementationin the complete diagnostic system, and includes several exmples that illustrate its capabilities.

A. Strojwas and P. Odryna, "PROD: A VLSI Fault Diagnosis System," in IEEE Design & Test of Computers, vol. 2, no. , pp. 27-35, 1985.
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