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Issue No. 05 - September/October (vol. 2)
ISSN: 0740-7475

The Future of Test (PDF)

pp. c2

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

D&T Scence (PDF)

pp. 9-14

An Integrated Design Automation System for VLSI Circuits (Abstract)

H. Kitazawa , Atsugi Electrical Communication Laboratories
O. Karatsu , Atsugi Electrical Communication Laboratories
T. Adachi , Atsugi Electrical Communication Laboratories
K. Ueda , Atsugi Electrical Communication Laboratories
T. Hoshino , Atsugi Electrical Communication Laboratories
M. Endo , Atsugi Electrical Communication Laboratories
pp. 17-26

A Knowledge-Based Logic Design System (Abstract)

Takao Uehara , Fujitsu Laboratories Ltd.
pp. 27-34

LORES-2: A Logic Reorganization System (Abstract)

Shunichiro Nakamura , Mitsubishi Electric Corporation
Takuji Ogihara , Mitsubishi Electric Corporation
Kiyoshi Enomoto , Mitsubishi Electric Corporation
Shinichi Murai , Mitsubishi Electric Corporation
pp. 35-42

Research in Design Automation for VLSI Layout (Abstract)

Tokinori Kozawa , Hitachi Central Research Laboratory
Hidekazu Terai , Hitachi Central Research Laboratory
pp. 43-53

HAL: A High-Speed Logic Simulation Machine (Abstract)

Nobuhiko Koike , NEC Corporation
Tohru Sasaki , NEC Corporation
Kenji Ohmori , NEC Corporation
pp. 61-73

A Fully-Automated Electron Beam Test System for VLSI Circuits (Abstract)

Takao Yano , Atsugi Electrical Communication Laboratory
Norio Kuji , Atsugi Electrical Communication Laboratory
Teruo Tamama , Atsugi Electrical Communication Laboratory
pp. 74-82

Milestones of New-Generation ATE (Abstract)

Tohru Kazamaki , Takeda Riken Company, Ltd.
pp. 83-89

D&T Interview (PDF)

pp. 90-97

D&T Roundtable (PDF)

pp. 100-105

D&T Conferences (PDF)

pp. 107-111

New Products Design (PDF)

J. Nash , Raytheon Co./ Missile Systems Div. / Hartwell Rd. / Bedford, MA 01730
pp. 112-115

New Products Test (PDF)

Conrad Zagwyn , LTX Corp., LTX Park at University, Westwood, MA 01090
pp. 116-117

D&T Standards (PDF)

pp. 120-122

D&T Education (PDF)

pp. 122

Calendar (PDF)

pp. 123

Call for Papers (PDF)

pp. 124

Book Reviews (PDF)

Robert Anderson , GenRad Inc., PO Box 32183, Phoenix, AZ 85064
pp. 125-127

IEEE Design&Test of Computers (PDF)

pp. 128-a-128-b

The Competition Gave Up (PDF)

pp. 128-c
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