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Issue No. 04 - July/August (1985 vol. 2)
ISSN: 0740-7475
pp: 69-77
A. Wilkinson , Teradyne Inc.
Because of its intended purpose, it is very complicated to diagnose faults in VLSI test system hardware. When this problemis considered in the hardware design phase, it is apparent that VLSI test systems need to have built-in self-test features.For a self-test to be of any value, the circuit check program should minimize the hardware involved in each test. MIND isan expert system for VLSI test system diagnosis that integrates the principles of their hierarchical design and experts' heuristicsto achieve a practical approach to reducing test system downtime.

A. Wilkinson, "MIND: An inside Look at an Expert System for Electronic Diagnosis," in IEEE Design & Test of Computers, vol. 2, no. , pp. 69-77, 1985.
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