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Issue No. 03 - May/June (vol. 2)
ISSN: 0740-7475

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

Advertisement (PDF)

pp. 6

From the Editor-in-Chief (PDF)

pp. 8-9

D&T Scene (PDF)

pp. 10-15

Structure Level Tools (PDF)

pp. 16

The Economics of Test (PDF)

pp. 18-19

Low-Cost Testers: Are They Really Low Cost? (Abstract)

G. Bowers , IBM Corporation
B. Pratt , IBM Corporation
pp. 20-28

A Basis for Setting Burn-in Yield Criteria (Abstract)

Anthony Van Den Heuvel , Motorola, Inc.
Noshir Khory , Motorola, Inc.
pp. 29-34

IEEE Design & Test of Computers (PDF)

pp. 110c-110

Goalie: A Space Efficient System for VLSI Artwork Analysis (Abstract)

Thomas Szymanski , AT&T Bell Laboratories
Christopher Van Wyk , AT&T Bell Laboratories
pp. 64-72

D&T Interview (PDF)

pp. 73-80

D&T Conferences (PDF)

pp. 81-86

D&T Research (Abstract)

pp. 87-100

New Products Test (PDF)

Conrad Zagwyn , LTX Corp., LTX Park at University, Westwood, MA 01090.
pp. 101-103

New Products Design (PDF)

J. Nash , Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730.
pp. 104-107

Moving? (PDF)

pp. 106

Calendar (PDF)

pp. 108-109

Call for Papers (PDF)

pp. 109

Book Reviews (PDF)

Robert Anderson , GenRad Inc., PO Box 32183, Phoenix, AZ 85064.
pp. 110

Advertiser Index?June 1985 (PDF)

pp. 110-b

IEEE Design&Test of Computers (PDF)

pp. 110-c-110-d
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