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Issue No. 03 - May/June (1985 vol. 2)
ISSN: 0740-7475
pp: 29-34
Anthony Van Den Heuvel , Motorola, Inc.
Noshir Khory , Motorola, Inc.
This simple, useful, and practical approach to assess the cost benefits from using burned-in plastic ICs assumes a simpleapproximation for early life failure during burn-in and predicts the failure rate of the residual parts on the basis of yieldpercentage. Because product applications, end-user environment, and device quality vary, the simplicity of this method isobtained at the cost of some rigor. Nonetheless, the results are useful and are consistent with measured data.

A. Van Den Heuvel and N. Khory, "A Basis for Setting Burn-in Yield Criteria," in IEEE Design & Test of Computers, vol. 2, no. , pp. 29-34, 1985.
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