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TABLE OF CONTENTS
Issue No. 02 - March/April (vol. 2)
ISSN: 0740-7475
Papers

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

Expert for PCB Design (PDF)

pp. 6-7

D&T Guest Editorial (PDF)

pp. 8-10

D&T Scene (PDF)

pp. 10-16

Moving? (PDF)

pp. 16

Built-In Self-Test Techniques (Abstract)

Edward McCluskey , Stanford University
pp. 21-28

Built-In Self-Test Structures (Abstract)

Edward McCluskey , Stanford University
pp. 29-36

Back Issues (PDF)

pp. 36

Implementing a Built-In Self-Test PLA Design (Abstract)

Hideo Fujiwara , McGill University
Vinod Agarwal , McGill University
Robert Treuer , McGill University
pp. 37-48

Advance Registration (PDF)

pp. 49

Self-Tested Data Flow Logic: A New Approach (Abstract)

Richard Illman , International Computers Limited
pp. 50-58

Built-In Self-Test Trends in Motorola Microprocessors (Abstract)

William Bruce , Motorola, Inc.
R. Daniels , Motorola, Inc.
pp. 64-71

Advertisement (PDF)

pp. 72

Fred Terman, the Father of Silicon Valley (Abstract)

Carolyn Tajnai , Stanford University
pp. 75-81

Implementing And Managing a CAD System Based on Vendor-Supplied Tools (Abstract)

Donald Lacy , Western Digital Corporation
Lawrence Drenan , Hughes Aircraft Corporation
pp. 82-87

Fault Modeling (Abstract)

pp. 88-95

New Products Test (PDF)

Conrad Zagwyn , LTX Corp., LTX Park at University, Westwood, MA 01090.
pp. 96-100

New Products Design (PDF)

J. Nash , Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730.
pp. 101-103

D&T Conferences (PDF)

pp. 104-105

Design Aids for VLSI: A Perspective Revisited (Abstract)

A. Sangiovanni-vincentelli , University of California, Berkeley
A. Newton , University of California, Berkeley
D. Pederson , University of California, Berkeley
pp. 106-115

Calendar (PDF)

pp. 116

D&T Education (PDF)

pp. 117

Book Reviews (PDF)

Robert Anderson , GenRad Inc., PO Box 32183, Phoenix, AZ 85064.
pp. 118-119

D&T Standards (PDF)

pp. 119

IEEE Design&Test of Computers (PDF)

pp. 120-a-120-b

Call for Papers (PDF)

pp. 120-c
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