Issue No. 02 - March/April (1985 vol. 2)
Richard Illman , International Computers Limited
The article describes a new approach to the self-testing and testability analysis of the types of logic structure encounteredin the data flow paths of computers. The main purpose of the new methodology is to avoid the costs associated with manualor automatic test pattern generation. Instead of relying upon an automated process of scanning through a gatelevel descriptionof the logic, this is an analytical approach applied to a block-level functional description of the logic structure. Thisapproach allows a hybrid test technique to be adopted, based on both random and pseudoexhaustive test styles, and gives faultcoverage figures in excess of 99.5 percent. The methodology is suitable only for highly structured and well-partitioned logicdesigns.
R. Illman, "Self-Tested Data Flow Logic: A New Approach," in IEEE Design & Test of Computers, vol. 2, no. , pp. 50-58, 1985.