The Community for Technology Leaders
RSS Icon
Issue No.06 - June (2012 vol.45)
pp: 64-71
Zhenyu Zhang , Institute of Software, Chinese Academy of Sciences, Beijing
W.K. Chan , City University of Hong Kong, Kowloon Tong
T.H. Tse , The University of Hong Kong, Pokfulam
Fault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically.
computing in Asia, software debugging, fault localization, failed test cases
Zhenyu Zhang, W.K. Chan, T.H. Tse, "Fault Localization Based Only on Failed Runs", Computer, vol.45, no. 6, pp. 64-71, June 2012, doi:10.1109/MC.2012.185
1. G.J. Myers, C. Sandler, and T. Badgett, The Art of Software Testing, 3rd ed., John Wiley & Sons, 2011.
2. RTI, The Economic Impacts of Inadequate Infrastructure for Software Testing, 2002; .
3. H. Cleve and A. Zeller, "Locating Causes of Program Failures," Proc. 27th Int'l Conf. Software Eng. (ICSE 05), ACM, 2005, pp. 342-351.
4. T.Y. Chen, T.H. Tse, and Z.Q. Zhou, "Semi-Proving: An Integrated Method for Program Proving, Testing, and Debugging," IEEE Trans. Software Eng., Jan. 2011, pp. 109-125.
5. S. Savage et al., "Eraser: A Dynamic Data Race Detector for Multithreaded Programs," ACM Trans. Computer Systems, Nov. 1997, pp. 391-411.
6. H. Agrawal et al., "Fault Localization Using Execution Slices and Dataflow Tests," Proc. 6th Int'l Symp. Software Reliability Eng. (ISSRE 95), IEEE CS, 1995, pp. 143-151.
7. M. Renieris and S.P. Reiss, "Fault Localization with Nearest Neighbor Queries," Proc. 18th IEEE Int'l Conf. Automated Software Eng. (ASE 03), IEEE CS, pp. 30-39.
8. J.A. Jones, M.J. Harrold, and J. Stasko, "Visualization of Test Information to Assist Fault Localization," Proc. 24th Int'l Conf. Software Eng. (ICSE 02), ACM, 2002, pp. 467-477.
9. Z. Zhang et al., "Capturing Propagation of Infected Program States," Proc. 7th Joint Meeting European Software Eng. Conf. and ACM SIGSOFT Int'l Symp. Foundations of Software Eng. (ESEC/FSE 09), ACM, 2009, pp. 43-52.
10. H. Cheng et al., "Identifying Bug Signatures Using Discriminative Graph Mining," Proc. 18th ACM SIGSOFT Int'l Symp. Software Testing and Analysis (ISSTA 09), ACM, 2009, pp. 141-152.
11. D. Saha et al., "Fault Localization for Data-Centric Programs," Proc. 19th ACM SIGSOFT Symp. and 13th European Conf. Foundations of Software Eng. (ESEC/FSE 11), ACM, 2011, pp. 157-167.
12. W.K. Chan and Y. Cai, "In Quest of the Science in Statistical Fault Localization," Software: Practice and Experience, 2011; doi:10.1002/spe.1147.
13. D. Hovemeyer and W. Pugh, "Finding Bugs Is Easy," ACM SIGPLAN Notices, Dec. 2004, pp. 92-106.
14. H. Agrawal and J.R. Horgan, "Dynamic Program Slicing," Proc. ACM SIGPLAN 1990 Conf. Programming Language Design and Implementation (PLDI 90), ACM, 1990, pp. 246-256.
15. R. Abreu et al., "A Practical Evaluation of Spectrum-Based Fault Localization," J. Systems and Software, Nov. 2009, pp. 1780-1792.
16. E. Säckinger, Broadband Circuits for Optical Fiber Communication, John Wiley & Sons, 2005.
17. H. Do, S. Elbaum, and G. Rothermel, "Supporting Controlled Experimentation with Testing Techniques: An Infrastructure and Its Potential Impact," Empirical Software Eng., Oct. 2005, pp. 405-435.
18. Y. Yu, J.A. Jones, and M.J. Harrold, "An Empirical Study of the Effects of Test-Suite Reduction on Fault Localization," Proc. 30th Int'l Conf. Software Eng. (ICSE 08), ACM, 2008, pp. 201-210.
51 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool