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Issue No. 02 - February (2011 vol. 44)
ISSN: 0018-9162
pp: 74-76
Bob Ward , IEEE Computer Society
ABSTRACT
Former IEEE Computer Society Board of Governors member Thomas W. Williams recently received the IEEE Computer Society Test Technology Technical Council’s Lifetime Contribution Award.
INDEX TERMS
test, TTTC, awards, medal of honor, scan-based test, Thomas W. Williams
CITATION
Bob Ward, "Tom Williams Wins TTTC Award", Computer, vol. 44, no. , pp. 74-76, February 2011, doi:10.1109/MC.2011.58
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