Issue No. 02 - February (2011 vol. 44)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MC.2011.58
Bob Ward , IEEE Computer Society
Former IEEE Computer Society Board of Governors member Thomas W. Williams recently received the IEEE Computer Society Test Technology Technical Council’s Lifetime Contribution Award.
test, TTTC, awards, medal of honor, scan-based test, Thomas W. Williams
Bob Ward, "Tom Williams Wins TTTC Award", Computer, vol. 44, no. , pp. 74-76, February 2011, doi:10.1109/MC.2011.58