Issue No. 05 - May (2001 vol. 34)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.920617
<p>To reduce manufacturing costs and time to market, we must develop efficient fault detection and location methods.</p>
S. Deniziak and K. Sapiecha, "Developing a High-Level Fault Simulation Standard," in Computer, vol. 34, no. , pp. 89-90, 2001.