Issue No. 11 - November (1999 vol. 32)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.803639
<p>Test engineers are already hard pressed to ensure the quality of ICs despite ever-shorter time to market and skyrocketing test costs. Nanometer technologies will only add to the challenge.</p>
R. Kapur and T. W. Williams, "Guest Editors' Introduction: Tough Challenges as Design and Test Go Nanometer," in Computer, vol. 32, no. , pp. 42-45, 1999.