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ABSTRACT
<p>Recently, designers have been embedding reusable modules to build on-chip systems that form rich libraries of predesigned, preverified building blocks. These embedded cores make it easier to import technology to a new system and differentiate the corresponding product by leveraging intellectual property advantages. Most importantly, design reuse shortens the time-to-market for new systems. The attributes that make system chips built with embedded IP cores an attractive methodology--design reuse, heterogeneity, reconfigurability, and customizability--also make testing and debugging these chips a complex challenge. The authors review the various alternatives for testing embedded cores and describe solutions and proposed standards that are expected to play a key role in developing the core-based design paradigm.</p>
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CITATION
Erik Jan Marinissen, Sujit Dey, Yervant Zorian, "Testing Embedded-Core-Based System Chips", Computer, vol. 32, no. , pp. 52-60, June 1999, doi:10.1109/2.769444
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