Issue No. 07 - July (1990 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.56855
<p>Design techniques to ensure the testability of embedded checkers that cannot be tested by scan-path bistables are presented. The discussion covers: types of error detectors; parity checkers and self-testing circuits; two-rail checkers; M-out-of-N checkers; and equality checkers. The techniques outline guarantee single stuck fault testability.</p>
E. McCluskey, "Design Techniques for Testable Embedded Error Checkers," in Computer, vol. 23, no. , pp. 84-88, 1990.