Issue No. 07 - July (1990 vol. 23)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.56854
<p>The defects that can occur when manufacturing VLSI ICs and the faults that can result are described. Some commonly used restructuring techniques for avoiding defective components are discussed. Several defect-tolerant designs of memory ICs, logic ICs, and wafer-scale circuits are presented. Yield models for predicting the yield of chips with redundancy are introduced, and the optimal amount of redundancy is determined.</p>
A. D. Singh and I. Koren, "Fault Tolerance in VLSI Circuits," in Computer, vol. 23, no. , pp. 73-83, 1990.