Issue No. 04 - April (1989 vol. 22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.25381
<p>A description is given of Gentest, with emphasis on STG2, a sequential test generator that uses the Back test-generation algorithm and the Split value model. The performance of STG2 on a Convex C-1 computer is compared with that of its predecessor, STG1 and STG1.5. Results are also presented for another set of experiments for Gentest on a Sun 3/60 workstation.</p>
W. Cheng and T. J. Chakraborty, "Gentest: An Automatic Test-Generation System for Sequential Circuits," in Computer, vol. 22, no. , pp. 43-49, 1989.