Issue No. 04 - April (1989 vol. 22)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/2.25379
<p>The authors survey high-level approaches to test generation for VLSI circuits, which can significantly reduce test generation time while still providing good fault coverage. High-level approaches view the circuit with less structural detail, that is, from a more abstract viewpoint and often hierarchically. The authors first review some basic circuit and fault models and the two most widely known test-generation algorithms as a basis for comparison between high-level and low-level techniques. The authors then examine the more important high-level approaches, which fall into two broad classes, namely algorithmic and heuristic.</p>
B. T. Murray, D. Bhattacharya and J. P. Hayes, "High-Level Test Generation for VLSI," in Computer, vol. 22, no. , pp. 16-24, 1989.