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Issue No. 06 - June (1982 vol. 15)
ISSN: 0018-9162
pp: 69-82
M.G. Buehler , Jet Propulsion Laboratory, California Institute of Technology
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CITATION

M. Buehler and M. Sievers, "Off Line, Built-in Test Techniques for VLSI Circuits," in Computer, vol. 15, no. , pp. 69-82, 1982.
doi:10.1109/MC.1982.1654052
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