Issue No.03 - March (1980 vol.13)
S.B. Akers , General Electric Company
Existing test generation procedures are rooted in the SSI/MSI era. New techniques will cope with today's vastly more complicated LSI/VLSI systems.
S.B. Akers, "Test Generation Techniques", Computer, vol.13, no. 3, pp. 9-15, March 1980, doi:10.1109/MC.1980.1653524