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Issue No. 03 - March (1980 vol. 13)
ISSN: 0018-9162
pp: 9-15
S.B. Akers , General Electric Company
ABSTRACT
Existing test generation procedures are rooted in the SSI/MSI era. New techniques will cope with today's vastly more complicated LSI/VLSI systems.
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CITATION
S.B. Akers, "Test Generation Techniques", Computer, vol. 13, no. , pp. 9-15, March 1980, doi:10.1109/MC.1980.1653524
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