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Issue No. 10 - October (1979 vol. 12)
ISSN: 0018-9162
pp: 40-47
W.A. Plice , Honeywell Incorporated
ABSTRACT
The bewildering changes currently facing designers and users of analog test equipment are leading to new techniques and improved hardware that should reduce test time by a factor of four within the next decade.
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CITATION
W.A. Plice, "Automatic Analog Testing - 1979 Style", Computer, vol. 12, no. , pp. 40-47, October 1979, doi:10.1109/MC.1979.1658496
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