Issue No. 10 - October (1979 vol. 12)
W.A. Plice , Honeywell Incorporated
The bewildering changes currently facing designers and users of analog test equipment are leading to new techniques and improved hardware that should reduce test time by a factor of four within the next decade.
W. Plice, "Automatic Analog Testing - 1979 Style," in Computer, vol. 12, no. , pp. 40-47, 1979.