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Issue No. 10 - October (1979 vol. 12)
ISSN: 0018-9162
pp: 32-38
E. Foley , Teradyne, Inc.
ABSTRACT
Increasing device complexity has brought increased responsibility both for test engineers and design engineers: design engineers must create testable designs; test engineers must report testability problems back to the designers.
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CITATION
E. Foley, "The Effects of the Microelectronics Revolution on Systems and Board Test", Computer, vol. 12, no. , pp. 32-38, October 1979, doi:10.1109/MC.1979.1658494
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