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Issue No. 10 - October (1979 vol. 12)
ISSN: 0018-9162
pp: 23-31
J.M. Crafts , Teradyne, Inc.
ABSTRACT
Semiconductor memory production relies hedvily on test technology. One testing technique?real-time bit mapping?offers more advantages than any other.
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CITATION
J.M. Crafts, "Techniques for Memory Testing", Computer, vol. 12, no. , pp. 23-31, October 1979, doi:10.1109/MC.1979.1658492
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