Issue No. 10 - October (1978 vol. 11)
G.L. Schnable , RCA Laboratories
CMOS IC<inf>s</inf>are being produced using a variety of processes, and considerable data is now available on their reliability and failure mechanisms.
G.L. Schnable, H.L. Pujol, L.J. Gallace, "Reliability of CMOS Integrated Circuits", Computer, vol. 11, no. , pp. 6-17, October 1978, doi:10.1109/C-M.1978.217937