Issue No. 10 - October (1978 vol. 11)
G.L. Schnable , RCA Laboratories
CMOS IC<inf>s</inf>are being produced using a variety of processes, and considerable data is now available on their reliability and failure mechanisms.
G. Schnable, H. Pujol and L. Gallace, "Reliability of CMOS Integrated Circuits," in Computer, vol. 11, no. , pp. 6-17, 1978.