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Issue No. 10 - October (1978 vol. 11)
ISSN: 0018-9162
pp: 6-17
G.L. Schnable , RCA Laboratories
ABSTRACT
CMOS IC<inf>s</inf>are being produced using a variety of processes, and considerable data is now available on their reliability and failure mechanisms.
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CITATION

G. Schnable, H. Pujol and L. Gallace, "Reliability of CMOS Integrated Circuits," in Computer, vol. 11, no. , pp. 6-17, 1978.
doi:10.1109/C-M.1978.217937
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