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Issue No. 07 - July (vol. 10)
ISSN: 0018-9162

Computer (PDF)

pp. c1

Table of Contents (PDF)

pp. 1

Special Messages (PDF)

pp. 2

Letters to the Editor (PDF)

pp. 9-11

Semiconductor Memories: New Dimensions in Storage Technology (PDF)

M.F. Slana , Bell Telephone Laboratories
pp. 12-13

The Implications of Electronic Serial Memories* (PDF)

G. Panigrahi , Bell Telephone Laboratories?
pp. 18-25

Reliability Testing for Industrial Use (PDF)

W.T. Greenwood , Reliability, Inc.
pp. 26-30

API Tests for RAM Chips (PDF)

V.P. Srini , Virginia Polytechnic Institute and State University
pp. 32-35

Workshop Report: A Computer Element Technology Update (PDF)

M.F. Slana , Bell Telephone Laboratories, Inc.
pp. 37-39


pp. 40-41

Special Feature Program Testing: Art Meets Theory* (PDF)

E.F. Miller , Software Research Associates
pp. 42-51

Wire Wrapping Center (PDF)

pp. 61

IEEE Computer Society bylaws (PDF)

pp. 110-115

The Open Channel (PDF)

pp. 74-76

New Products (PDF)

D.A. Michalopoulos , California State University
pp. 78-83

New Literature (PDF)

pp. 82-83

New Applications (PDF)

D.A. Michalopoulos , California State University
pp. 85-86

Calendar (PDF)

pp. 88-95

Call for Papers (PDF)

pp. 89

Classified Ads (PDF)

pp. 93

Repository (PDF)

pp. 96-99

IEEE Computer Society (PDF)

pp. 106-107

IEEE Computer Society Bylaws (PDF)

pp. 110-115

Book Reviews (PDF)

pp. 116-118
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