The Community for Technology Leaders
Green Image
Issue No. 07 - July (1977 vol. 10)
ISSN: 0018-9162
pp: 32-35
V.P. Srini , Virginia Polytechnic Institute and State University
ABSTRACT
With 16K RAM chips already in commercial use and 64K RAM chips being planned, the increasing length of time needed to run test patterns could lead to cost increases that would offset the advantages of the larger devices. For example, many existing tests of the important pattern-sensitive-fault class, such as galloping 0's and 1's,* require a test length proportional to the square of the number of bits in the RAM chip.<sup>1-4</sup>Clearly, the time consumed by such tests looms as a major component in the overall costs of chip production.
INDEX TERMS
null
CITATION
V.P. Srini, "API Tests for RAM Chips", Computer, vol. 10, no. , pp. 32-35, July 1977, doi:10.1109/C-M.1977.217778
91 ms
(Ver 3.1 (10032016))