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Issue No. 06 - Nov.-Dec. (2015 vol. 35)
ISSN: 0272-1716
pp: 11-17
Paulo Dias , DETI, IEETA, University of Aveiro
Luis Neves , University of Aveiro
Daniel Santos , University of Aveiro
Catarina Coelho , University of Coimbra
Maria Teresa Ferreira , Forensic Sciences Center and University of Coimbra
Helder Santos , Grupo Dryas Octopetala
Samuel Silva , IEETA, University of Aveiro
Beatriz Sousa Santos , DETI, IEETA, University of Aveiro
ABSTRACT
Craniometric analysis plays an important role in anthropology studies and forensics. This paper presents CraMs, an application using a new craniometric approach based on 3D models of the skull. The main objective is to obtain, through a process supervised by anthropologists, the main points of interest used to compute craniometric measurements. The application aids this process by analyzing the skull geometry and automatically providing points of interest. The application also allows for semiautomatic point detection, where the user provides an initial guess that might be refined based on the curvature of the skull, as well as the manual selection of any other points of interest. Moreover, results comparing measurements obtained with CraMs and traditional craniometry methods on eight skulls suggest that the application provides comparable craniometric measurements and lower inter-observer variability. This approach offers advantages such as an easier access to skulls with no risk of bone damage and the possibility of defining new measurements based on morphology or other skull characteristics, which are not possible using traditional methods.
INDEX TERMS
Three-dimensional displays, Extraterrestrial measurements, Anthropology, Measurement uncertainty, Skull, Solid modeling, Analytical models,feature detection, computer graphics, graphics applications, craniometry, morphology, 3D models
CITATION
Paulo Dias, Luis Neves, Daniel Santos, Catarina Coelho, Maria Teresa Ferreira, Helder Santos, Samuel Silva, Beatriz Sousa Santos, "CraMs: Craniometric Analysis Application Using 3D Skull Models", IEEE Computer Graphics and Applications, vol. 35, no. , pp. 11-17, Nov.-Dec. 2015, doi:10.1109/MCG.2015.136
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