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Issue No. 02 - March/April (2007 vol. 27)
ISSN: 0272-1716
pp: 68-76
Theodore Kim , University of North Carolina at Chapel Hill
Avneesh Sud , University of North Carolina at Chapel Hill
Ming C. Lin , University of North Carolina at Chapel Hill
Jason Sewall , University of North Carolina at Chapel Hill
ABSTRACT
Laplacian instability is the physical mechanism driving pattern formation in many disparate natural phenomena. Current algorithms for simulating this instability are slow and memory intensive. A new algorithm, based on the dielectric breakdown model from physics, is more than three orders of magnitude faster than previous methods and decreases memory use by two orders of magnitude.
INDEX TERMS
procedural texturing, natural phenomena, fractals, diffusion limited aggregation, dielectric breakdown model
CITATION
Theodore Kim, Avneesh Sud, Ming C. Lin, Jason Sewall, "Fast Simulation of Laplacian Growth", IEEE Computer Graphics and Applications, vol. 27, no. , pp. 68-76, March/April 2007, doi:10.1109/MCG.2007.33
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