IEEE Transactions on Pattern Analysis and Machine Intelligence

IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI) is a scholarly archival journal published monthly. This journal covers traditional areas of computer vision and image understanding, all traditional areas of pattern analysis and recognition, and selected areas of machine intelligence. Read the full scope of TPAMI


From the May 2015 issue

Retrieving Similar Styles to Parse Clothing

By Kota Yamaguchi, M. Hadi Kiapour, Luis E. Ortiz, and Tamara L. Berg

Featured article thumbnail imageClothing recognition is a societally and commercially important yet extremely challenging problem due to large variations in clothing appearance, layering, style, and body shape and pose. In this paper, we tackle the clothing parsing problem using a retrieval-based approach. For a query image, we find similar styles from a large database of tagged fashion images and use these examples to recognize clothing items in the query. Our approach combines parsing from: pre-trained global clothing models, local clothing models learned on the fly from retrieved examples, and transferred parse-masks (Paper Doll item transfer) from retrieved examples. We evaluate our approach extensively and show significant improvements over previous state-of-the-art for both localization (clothing parsing given weak supervision in the form of tags) and detection (general clothing parsing). Our experimental results also indicate that the general pose estimation problem can benefit from clothing parsing.

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