Thomas W. Williams Wins Lifetime Contribution Award

LOS ALAMITOS, Calif., 7 December, 2010 – Thomas W. Williams, a former IEEE Computer Society Board of Governors member, is the recipient of the IEEE Computer Society Test Technology Technical Council’s Lifetime Contribution Award.
 
Williams, former Fellow at Synopsys and consultant at Synopsys, is the founder and chair of the annual IEEE Computer Society Workshop on Design for Testability and co-founder of the European Workshop on Design for Testability. He is also was the chair of the IEEE Technical Subcommittee on Design for Testability.
 
Williams was previously a senior technical staff member and manager of the VLSI Design for Testability group with IBM’s Microelectronics Division in Boulder, Colorado. He holds a BSEE from Clarkson University, an MA in pure mathematics from the State University of New York at Binghamton, and a PhD in electrical engineering from Colorado State University.
 
Williams has been a program committee member and keynote speaker at many testing conferences. He served as a Computer Society Distinguished Visiting Speaker from 1982 to 1985 and has been a special-issue editor for both IEEE Transactions on Computers and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. He has written four book chapters and many papers on testing, edited a book, and recently co-authored another book entitled Structured Logic Testing.
 
Williams, was one of the early inventors of the scan-based test solution, he has received a number of best paper awards, including the 1987 Outstanding Paper Award from the IEEE International Test Conference for his work in the area of VLSI Self-Testing, a 1987 Outstanding Paper Award from the CompEuro'87 for his work on Self-Test, a 1989 Outstanding Paper Award (Honorable Mention) from the IEEE International Test Conference for his work on AC Test Quality, and a 1991 Outstanding Paper Award from the ACM/IEEE Design Automation Conference for his work in the area of Synthesis and Testing.
 
An IEEE Fellow since 1989, Williams shared the IEEE Computer Society Wallace McDowell Award with Edward B. Eichelberger in 1989 for their outstanding contributions to level-sensitive scan techniques and design for testability concepts. . In 2007 Dr. Williams received the European Design and Automation Association Lifetime Achievement Award for "outstanding contributions to the state of the art in electronic design, automation, and testing of electronic systems."
 
"Tom Williams stands out, not only as being part of the seminal team that brought structure to design in order to make systematic testing possible, but also as a committed lifetime believer and tireless advocate for moving the state of the art forward,” said Aart de Geus, chairman and CEO of Synopsys. “Indeed, if one were to confer him a title, Tom would be the ultimate ‘Ambassador of Test’ as his depth in the field shines through his being both a scholar and a gentleman.”

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