FPGA-based testing strategy for cryptographic chips: A case study on Elliptic Curve Processor for RFID tags
On-Line Testing Symposium, IEEE International
By Junfeng Fan, Miroslav Knezevic, Dusko Karaklajic, Roel Maes, Vladimir Rozic, Lejla Batina, Ingrid Verbauwhede
Issue Date:June 2009
Testing of cryptographic chips or components has one extra dimension: physical security. The chip designers should improve the design if it leaks too much information through side-channels, such as timing, power consumption, electric-magnetic radiation, an...