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Efficient Transparency Extraction and Utilization in Hierarchical Test
Found in: VLSI Test Symposium, IEEE
By Yiorgos Makris, Vishal Patel, Alex Orailoglu
Issue Date:April 2001
pp. 0246
We introduce a methodology for identifying transparency behavior appropriate for hierarchical test, based on the theoretical principles of transparency composition. Unlike high level approaches that identify limited, coarse transparency behavior, the propo...